Title :
Single-event effect radiation test results of radiation-hardened IEEE1394 Firewire ASICs [space applications]
Author :
Pritchard, Bruce E. ; Underwood, Joe B. ; Murlin, W. Doug ; Coleman, Andrea M. ; Wolfram, Kenneth D. ; Warner, Jeff B. ; Hafer, Craig C.
Author_Institution :
Northrop Grumman Space Technol., Redondo Beach, CA, USA
Abstract :
This work presents single-event radiation test results for two Aeroflex IEEE1394 Firewire ASICs developed by the National Polar-orbiting Operational Environmental Satellite System (NPOESS) Integrated Program Office. Both ASICs performed very well and met all NPOESS radiation requirements for space usage.
Keywords :
IEEE standards; application specific integrated circuits; integrated circuit testing; ion beam effects; peripheral interfaces; radiation hardening (electronics); space vehicle electronics; NPOESS radiation requirements; heavy ion radiation testing; high energy ions; radiation-hardened IEEE1394 Firewire ASIC; radiation-hardened data bus; single-event effects; space applications; Ambient intelligence; Application specific integrated circuits; Firewire; Foundries; Libraries; Physical layer; Satellites; Space technology; Springs; Testing;
Conference_Titel :
Radiation Effects Data Workshop, 2004 IEEE
Conference_Location :
Atlanta, GA, USA
Print_ISBN :
0-7803-8697-3
DOI :
10.1109/REDW.2004.1352915
