DocumentCode :
1838469
Title :
"Extracting the Required Reflection to Compensate the Sealed Connector of a Microstrip Fixture"
Author :
Stinehelfer, Harold E., Sr.
Author_Institution :
Made-it Associates, Inc. 40 West St. Lunenburg, MA 01462
Volume :
22
fYear :
1992
fDate :
Dec. 1992
Firstpage :
189
Lastpage :
197
Abstract :
The microstrip test fixture with sealed connectors was tested and converted to the time domain to reveal the reflections at each connector. The MAMA program was used to make the measurements using the new hp8510c analyzer and the PC-486 controller. This is an experimental micro strip line in an empty box housing. A capacitive demonstration file was then used to modify the connectors by "injecting" into the experiment a capacitive reflection. The results gave the same result as if an actual capacitance had been added to the test fixture connector.
Keywords :
Capacitance; Connectors; Fixtures; Frequency measurement; Inductance; Insertion loss; Loss measurement; Microstrip; Reflection; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
ARFTG Conference Digest-Fall, 40th
Conference_Location :
Orlando, FL, USA
Print_ISBN :
0-7803-5686-1
Type :
conf
DOI :
10.1109/ARFTG.1992.326985
Filename :
4119671
Link To Document :
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