Title :
Application of fractal dimension method of functional MRI time-series to limbic dysregulation in anxiety study
Author_Institution :
Polish Acad. of Sci., Warsaw
Abstract :
Functional magnetic resonance imaging (fMRI) allows to investigate the amplitude of activation in neural networks of brain. In this work we present the results of fMRI time-series analysis performed to identify the process of dysregulation of dynamic interaction between different limbic system regions in healthy adults in state of increased anxiety. The results obtain for 65 healthy adults using nonlinear dynamics methods like fractal dimension confirm the key roles of the bilateral amygdala, bilateral hippocampus, BA9 (dorsolateral prefrontal cortex), and BA45 (ventromedial prefrontal cortex) in modulating emotional response in healthy adults. For different regions of interest (ROIs) significant correlations were found not only for the neutral respective rest but also for fear and angry contrasts.
Keywords :
biology computing; biomedical MRI; brain; emotion recognition; fractals; neural nets; nonlinear dynamical systems; BA45; BA9; angry contrasts; bilateral amygdala; bilateral hippocampus; brain; dorsolateral prefrontal cortex; fear; fractal dimension method; functional MRI time-series; functional magnetic resonance imaging; healthy adults; limbic dysregulation; modulating emotional response; neural networks; nonlinear dynamics methods; ventromedial prefrontal cortex; Biomedical engineering; Cybernetics; Electroencephalography; Fractals; Head; Hippocampus; Magnetic analysis; Magnetic resonance imaging; Nonlinear dynamical systems; Time series analysis; Adult; Algorithms; Anxiety; Brain Mapping; Female; Fractals; Humans; Image Enhancement; Image Interpretation, Computer-Assisted; Information Storage and Retrieval; Limbic System; Magnetic Resonance Imaging; Male; Reproducibility of Results; Sensitivity and Specificity;
Conference_Titel :
Engineering in Medicine and Biology Society, 2007. EMBS 2007. 29th Annual International Conference of the IEEE
Conference_Location :
Lyon
Print_ISBN :
978-1-4244-0787-3
DOI :
10.1109/IEMBS.2007.4353063