Title :
Low cost/high volume laser modules using silicon optical bench technology
Author :
Osenbach, J.W. ; Dautartas, M.F. ; Pitman, E. ; Nijander, C. ; Brady, M. ; Schlenker, R.K. ; Butrie, T. ; Scrak, S.P. ; Auker, B.S. ; Kern, D. ; Salko, S. ; Rinaudo, D. ; Whitcraft, C. ; Dormer, J.F.
Author_Institution :
Bell Lab. Innovation, Lucent Technol., Breinigsville, PA, USA
Abstract :
Reports on the use of SiOB technology used in the production of low cost/high volume, reliable edge emitting laser modules. The SiOB platform is designed for manufacturability, reduced parts count, reduced process steps, and ability to accept design changes to respond to a rapidly changing marketplace. For example, this SiOB technology has been used for at least four different laser designs/types without significant changes in the process. The SiOB technology is the first of its kind in that it integrates: i) silicon micromachining for the lens holder cavities and back face monitor turning mirror, ii) Ti/Pt/Au for interconnect metalization, photodiode bonding, and turning mirror iii) aluminum for AlO bonding attachment of the lens, and iv) Au/Sn solder for laser attachment. The laser and photodiode are passively aligned using a visual alignment system and fiducials on the silicon. The lens is self-aligned to the silicon during the AlO bonding process
Keywords :
elemental semiconductors; integrated optics; micromachining; modules; semiconductor device metallisation; semiconductor lasers; silicon; AlO; Si; SiOB technology; Ti-Pt-Au; back face monitor turning mirror; bonding attachment; edge emitting laser; interconnect metallization; laser modules; lens holder cavities; manufacturability; micromachining; parts count; photodiode bonding; process steps; silicon optical bench technology; solder; visual alignment system; Bonding; Costs; Gold; Lenses; Mirrors; Photodiodes; Production; Silicon; Stimulated emission; Turning;
Conference_Titel :
Electronic Components & Technology Conference, 1998. 48th IEEE
Conference_Location :
Seattle, WA
Print_ISBN :
0-7803-4526-6
DOI :
10.1109/ECTC.1998.678753