DocumentCode
1838560
Title
Computer aided simulation and verification of forward error-correcting biosensors
Author
Liu, Yang ; Chakrabartty, Shantanu
fYear
2008
fDate
18-21 May 2008
Firstpage
1826
Lastpage
1829
Abstract
Factors that affect the accuracy of the biosensor systems range from errors in device fabrication to stochastic interaction between biomolecules. In this paper we present a framework for designing and evaluating biosensor encoding and decoding algorithms based on forward error-correcting (FEC) principles, which can improve the accuracy of pathogen detection. The model biosensor used in this paper is an immunosensor that uses computational primitives inherent in antigen-antibody interaction to achieve a transistor like operation. Fundamental logic gates have been embedded into an equivalent low-density parity check (LDPC) biosensor encoder and a corresponding sum- product decoding algorithm is presented for error correction. The performance of the encoding-decoding algorithm has been verified using behavioral simulations demonstrating its utility for designing reliable biosensors. The simulation study also reveals a novel co-detection principle that can be a promising method for significantly enhancing the pathogen detection limit.
Keywords
biosensors; error correction codes; forward error correction; antigen-antibody interaction; behavioral simulation; biomolecules; biosensor decoding; biosensor encoding; biosensor system range; computer aided simulation; encoding-decoding algorithm; error correction; forward error-correcting biosensor; immunosensor; low-density parity check biosensor encoder; pathogen detection; stochastic interaction; sum-product decoding; Algorithm design and analysis; Biosensors; Computational modeling; Computer errors; Computer simulation; Decoding; Fabrication; Parity check codes; Pathogens; Stochastic systems; Forward error-correcting biosensors; co-detection; sum-product algorithm;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 2008. ISCAS 2008. IEEE International Symposium on
Conference_Location
Seattle, WA
Print_ISBN
978-1-4244-1683-7
Electronic_ISBN
978-1-4244-1684-4
Type
conf
DOI
10.1109/ISCAS.2008.4541795
Filename
4541795
Link To Document