Title :
An Automated Non-Linear Transistor Characterization System with a High-Level Language User-Interface for Easy Control, Visualization and Data Management
Author :
Ghannouchi, F.M. ; Kouki, A.B. ; Beauregard, F.
Author_Institution :
Microwave Research Laboratory, Ecole Polytechnique de Montreal, Montreal, Quebec, CANADA
Abstract :
In this paper, a system for the extensive non-linear characterization of microwave transistors is presented. The high level language user interface for its automatic control and near real time visualization and management of the measured data is highlighted. Some descriptive pictures and experimental results are presented to illustrate the versatility of the system and the efficacy of the interfacing software.
Keywords :
Automatic control; Calibration; Control systems; Data visualization; Frequency measurement; Hardware; High level languages; Nonlinear control systems; Power measurement; Software measurement;
Conference_Titel :
ARFTG Conference Digest-Spring, 41st
Conference_Location :
Atlanta, GA, USA
Print_ISBN :
0-7803-5686-1
DOI :
10.1109/ARFTG.1993.327014
