Title :
On The Design of New Integrated Microprobes (NIMPs) for Non-Linear On-Wafer Device Characterization
Author :
Xu, Y. ; Maurin, D. ; Wu, K. ; Huyart, B. ; Klemer, D. ; Bosisio, R.G.
Author_Institution :
Ecole Polytechnique de Montréal, CP 6079, succ. A, Montréal, Canada H3C 3A7
Keywords :
Bandwidth; Circuit simulation; Circuit testing; Coaxial components; Coplanar waveguides; Detectors; Frequency; Gallium arsenide; MMICs; Probes;
Conference_Titel :
ARFTG Conference Digest-Spring, 41st
Conference_Location :
Atlanta, GA, USA
Print_ISBN :
0-7803-5686-1
DOI :
10.1109/ARFTG.1993.327020
