DocumentCode :
1839087
Title :
Large-signal modeling of GaN FET and nonlinearity analysis using Volterra series
Author :
Islam, S.S. ; Anwar, A.F.M.
Author_Institution :
Dept. of Electr. & Comput. Eng., Connecticut Univ., Storrs, CT, USA
fYear :
2002
fDate :
3-4 June 2002
Firstpage :
351
Lastpage :
354
Abstract :
A large-signal model is reported to investigate the nonlinearities of a GaN MESFET. The model developed accounts for the observed current collapse and frequency dispersion of output resistance and transconductance and uses Volterra series technique to determine the nonlinearities. Calculated f/sub T/ and f/sub max/ of a 0.8 /spl mu/m/spl times/150 /spl mu/m GaN MESFET are 6.5 GHz and 13 GHz, respectively, and are in close agreement with their measured values of 6 GHz and 14 GHz, respectively. For a 1.0 /spl mu/m/spl times/150 /spl mu/m FET operating at 1 GHz, 1-dB compression point and output referred third-order intercept point (OIP3) are 18 dBm and 25.3 dBm, respectively. The corresponding quantities are 19.6 dBm and 30.5 dBm for a 0.6 /spl mu/m/spl times/150 /spl mu/m FET at same frequency. Similar Improvements in third-order intermodulation (IM3) for shorter gate length devices are reported.
Keywords :
III-V semiconductors; Volterra series; gallium compounds; intermodulation; microwave field effect transistors; microwave power transistors; power MESFET; semiconductor device models; wide band gap semiconductors; 1 GHz; 13 GHz; 6.5 GHz; Boltzman constant; GaN; MESFET; Volterra series; compression point; current collapse; depletion layer; frequency dispersion; large-signal model; nonlinearity analysis; output referred third-order intercept point; output resistance; third-order intermodulation; transconductance; Current measurement; Electrical resistance measurement; Electron traps; FETs; Frequency; Gallium nitride; MESFETs; Temperature; Thermal conductivity; Transconductance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Radio Frequency Integrated Circuits (RFIC) Symposium, 2002 IEEE
Conference_Location :
Seattle, WA, USA
ISSN :
1529-2517
Print_ISBN :
0-7803-7246-8
Type :
conf
DOI :
10.1109/RFIC.2002.1012065
Filename :
1012065
Link To Document :
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