Title :
Direct parameter extraction on RF-CMOS
Author_Institution :
Centre Suisse d´Electronique et de Microtechnique SA, Neuchatel, Switzerland
Abstract :
A good knowledge of all parameters of the models used with circuit simulation is one of the major prerequisites for a successful design. This is particularly true for the design of analog RF circuits. An efficient and accurate method to directly extract the parameters needed for accurate modeling of transistors in a standard CMOS sub-micron technology for RF-applications is presented. The paper concentrates on the extraction procedure, with emphasis on its simplicity, hence excluding fitting or optimization, and on the accuracy of its results. The extracted parameters are applied to a first order nonquasistatic model and the simulation results compared with measurements. Excellent agreement between simulations and measurements up to 50 GHz is achieved.
Keywords :
CMOS analogue integrated circuits; circuit simulation; equivalent circuits; field effect MIMIC; field effect MMIC; impedance matrix; integrated circuit modelling; 3-port Y-parameter matrix; 50 GHz; RF-CMOS; Z-parameter matrix; access resistances; active integrated devices; circuit simulations; curve fitting; direct parameter extraction; equivalent circuit; first order nonquasistatic model; impedance matrix; small signal model; CMOS technology; Capacitance; Circuit simulation; Curve fitting; Impedance; Integrated circuit modeling; MOSFETs; Parameter extraction; Radio frequency; Semiconductor device modeling;
Conference_Titel :
Radio Frequency Integrated Circuits (RFIC) Symposium, 2002 IEEE
Conference_Location :
Seattle, WA, USA
Print_ISBN :
0-7803-7246-8
DOI :
10.1109/RFIC.2002.1012066