DocumentCode
1839135
Title
Direct parameter extraction on RF-CMOS
Author
Pengg, F.X.
Author_Institution
Centre Suisse d´Electronique et de Microtechnique SA, Neuchatel, Switzerland
fYear
2002
fDate
3-4 June 2002
Firstpage
355
Lastpage
358
Abstract
A good knowledge of all parameters of the models used with circuit simulation is one of the major prerequisites for a successful design. This is particularly true for the design of analog RF circuits. An efficient and accurate method to directly extract the parameters needed for accurate modeling of transistors in a standard CMOS sub-micron technology for RF-applications is presented. The paper concentrates on the extraction procedure, with emphasis on its simplicity, hence excluding fitting or optimization, and on the accuracy of its results. The extracted parameters are applied to a first order nonquasistatic model and the simulation results compared with measurements. Excellent agreement between simulations and measurements up to 50 GHz is achieved.
Keywords
CMOS analogue integrated circuits; circuit simulation; equivalent circuits; field effect MIMIC; field effect MMIC; impedance matrix; integrated circuit modelling; 3-port Y-parameter matrix; 50 GHz; RF-CMOS; Z-parameter matrix; access resistances; active integrated devices; circuit simulations; curve fitting; direct parameter extraction; equivalent circuit; first order nonquasistatic model; impedance matrix; small signal model; CMOS technology; Capacitance; Circuit simulation; Curve fitting; Impedance; Integrated circuit modeling; MOSFETs; Parameter extraction; Radio frequency; Semiconductor device modeling;
fLanguage
English
Publisher
ieee
Conference_Titel
Radio Frequency Integrated Circuits (RFIC) Symposium, 2002 IEEE
Conference_Location
Seattle, WA, USA
ISSN
1529-2517
Print_ISBN
0-7803-7246-8
Type
conf
DOI
10.1109/RFIC.2002.1012066
Filename
1012066
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