• DocumentCode
    1839135
  • Title

    Direct parameter extraction on RF-CMOS

  • Author

    Pengg, F.X.

  • Author_Institution
    Centre Suisse d´Electronique et de Microtechnique SA, Neuchatel, Switzerland
  • fYear
    2002
  • fDate
    3-4 June 2002
  • Firstpage
    355
  • Lastpage
    358
  • Abstract
    A good knowledge of all parameters of the models used with circuit simulation is one of the major prerequisites for a successful design. This is particularly true for the design of analog RF circuits. An efficient and accurate method to directly extract the parameters needed for accurate modeling of transistors in a standard CMOS sub-micron technology for RF-applications is presented. The paper concentrates on the extraction procedure, with emphasis on its simplicity, hence excluding fitting or optimization, and on the accuracy of its results. The extracted parameters are applied to a first order nonquasistatic model and the simulation results compared with measurements. Excellent agreement between simulations and measurements up to 50 GHz is achieved.
  • Keywords
    CMOS analogue integrated circuits; circuit simulation; equivalent circuits; field effect MIMIC; field effect MMIC; impedance matrix; integrated circuit modelling; 3-port Y-parameter matrix; 50 GHz; RF-CMOS; Z-parameter matrix; access resistances; active integrated devices; circuit simulations; curve fitting; direct parameter extraction; equivalent circuit; first order nonquasistatic model; impedance matrix; small signal model; CMOS technology; Capacitance; Circuit simulation; Curve fitting; Impedance; Integrated circuit modeling; MOSFETs; Parameter extraction; Radio frequency; Semiconductor device modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radio Frequency Integrated Circuits (RFIC) Symposium, 2002 IEEE
  • Conference_Location
    Seattle, WA, USA
  • ISSN
    1529-2517
  • Print_ISBN
    0-7803-7246-8
  • Type

    conf

  • DOI
    10.1109/RFIC.2002.1012066
  • Filename
    1012066