Title :
Low frequency noise characterization and modeling of microwave bipolar devices : application to the design of low phase noise oscillator
Author :
Bary, L. ; Cibiel, G. ; Telliez, I. ; Rayssac, J. ; Rennane, A. ; Boulanger, C. ; Llopis, O. ; Borgarino, M. ; Plana, R. ; Graffeuil, J.
Author_Institution :
Lab. d´Autom. et d´Anal. des Syst., CNRS, Toulouse, France
Abstract :
This paper addresses advanced low frequency noise measurements and modeling of SiGe HBTs. Results have been implemented into a nonlinear Gummel Poon model which has been validated through the design of a DRO made of an integrated SiGe negative resistance in the 10 GHz range. We have obtained phase noise of -105 dBc/Hz at 10 kHz offset, which is close to the state of the art, and we have demonstrated a design technique that provides an accurate phase noise prediction.
Keywords :
1/f noise; Ge-Si alloys; MMIC oscillators; heterojunction bipolar transistors; microwave bipolar transistors; phase noise; semiconductor device models; semiconductor device noise; shot noise; 10 GHz; BiCMOS technology; DRO; SiGe; X band range; integrated negative resistance; intrinsic noise sources; low frequency noise characterization; low phase noise oscillator; microwave bipolar devices; modeling; nonlinear Gummel Poon model; off-chip dielectric resonator; series feedback topology; shot noise; Electrical resistance measurement; Frequency measurement; Germanium silicon alloys; Heterojunction bipolar transistors; Low-frequency noise; Microwave devices; Microwave oscillators; Noise measurement; Phase noise; Silicon germanium;
Conference_Titel :
Radio Frequency Integrated Circuits (RFIC) Symposium, 2002 IEEE
Conference_Location :
Seattle, WA, USA
Print_ISBN :
0-7803-7246-8
DOI :
10.1109/RFIC.2002.1012067
