Long term exposure electromagnetic effects on discrete analog and digital electronic devices

A determination is made of the effects of long term exposure of analog and digital electronic devices to electromagnetic (EM) fields in the radio frequency range of 700 MHz to 18 GHz. Test results are used to determine short term and long term reliability of electronic devices and systems when exposed to EM environments. This study involves design and fabrication of a mode-stirred reverberation chamber, a test stimulus and data acquisition system and test fixtures; test part selection; test plan development; functional test, EM exposure test; evaluation of the EM exposure and functional test data; and reliability assessment. EM exposure testing has been completed, the final functional test is under way, and we are in the process of data analysis and reliability assessment. Test data indicates that the test devices are susceptible to EM upset within the frequency range of 700 MHz to 8 GHz. Above 8 GHz the effects of the EM field, although they might be significant, would not cause the devices to upset. In addition to device upset, changes in the devices have occurred as confirmed by the parametric tests. Preliminary analysis of the data shows different and greater parameter shifts in devices subjected to EM exposure than those in the control group, which were not exposed to EM radiation