• DocumentCode
    1839338
  • Title

    Packaging of VCSEL, MC-LED and detector 2-D arrays

  • Author

    Hall, J.P. ; Goodwin, M.J. ; Lewandowski, J.J. ; Them, E.M. ; Robbins, D.J.

  • Author_Institution
    GEC Marconi Mater. Technol. Ltd., Caswell, UK
  • fYear
    1998
  • fDate
    25-28 May 1998
  • Firstpage
    778
  • Lastpage
    782
  • Abstract
    An alignment and mounting scheme has been devised for the hybrid integration of Vertical Cavity Surface-Emitting Lasers (VCSEL), Micro-Cavity Light-Emitting Diodes (MCLED) and photodetector arrays with Si CMOS chips for optical interconnection of integrated circuits. Assembly processes are being developed for an area interconnect test bed being realised in the EC-funded ESPRIT-MELARI project OIIC (“Optically Interconnected Integrated Circuits”). Here, short inter-chip (or intra-chip) links are based on a free-space optical pathway with micromirrors and microlenses while longer inter-chip interconnects within or between Multi-Chip Modules (MCMs) are being realised using Plastic Optical Fibre (POF) arrays configured in an Optical Pathway Block (OPE). Alignment accuracies in the region of ±20 μm are required for interfacing between the optoelectronic devices and the optical pathway
  • Keywords
    CMOS integrated circuits; flip-chip devices; integrated optoelectronics; light emitting diodes; microassembling; optical interconnections; packaging; photodetectors; semiconductor laser arrays; soldering; surface emitting lasers; ESPRIT-MELARI project OIIC; MCM; Si; Si CMOS chips; VCSEL arrays; alignment scheme; area interconnect test bed; assembly processes; detector 2D arrays; free-space optical pathway; hybrid flip-chip solder bonding; hybrid integration; integrated circuits; inter-chip links; intra-chip links; light-emitting diodes; micro-cavity LED arrays; microlenses; micromirrors; mounting scheme; multi-chip modules; optical interconnection; optoelectronic devices; photodetector arrays; plastic optical fibre arrays; surface-emitting lasers; vertical cavity SEL; Circuit testing; Detectors; Integrated circuit interconnections; Optical arrays; Optical fibers; Optical interconnections; Packaging; Semiconductor laser arrays; Sensor arrays; Vertical cavity surface emitting lasers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components & Technology Conference, 1998. 48th IEEE
  • Conference_Location
    Seattle, WA
  • ISSN
    0569-5503
  • Print_ISBN
    0-7803-4526-6
  • Type

    conf

  • DOI
    10.1109/ECTC.1998.678795
  • Filename
    678795