Title :
Techniques for Automated On-Wafer Measurements of Sub-30PS Transition-Time Pulse and Data Amplifiers
Author :
Fisher, Robert A. ; Kerwin, Kevin J.
Author_Institution :
Hewlett-Packard Company, Microwave Technology Division, M/S 1US-E, 1412 Fountaingrove Parkway, Santa Rosa, CA 95403-1788 (707) 577-3674
Abstract :
Techniques for calibrating and measuring the relative time of arrivals of pulse edges for wafer-probed pulse amplifier ICs are described. Fixturing, waveform dependency, and dc measurement are considered. Criteria for selecting an appropriate level of calibration are described. These techniques are successfully applied in the measurement of sub-30 ps edge transitions from a pulse amplifier IC.
Keywords :
Fixtures; Instruments; Integrated circuit measurements; Microwave technology; Pulse amplifiers; Pulse generation; Pulse measurements; Pulsed power supplies; Transmission line measurements; Voltage;
Conference_Titel :
ARFTG Conference Digest-Fall, 42nd
Conference_Location :
San Jose, CA, USA
Print_ISBN :
0-7803-5686-1
DOI :
10.1109/ARFTG.1993.327041
