• DocumentCode
    1839509
  • Title

    Schottky junction transistors for micropower RFICs

  • Author

    Spann, J. ; Zhiyuan Wu ; Jaconelli, P. ; Jinman Yang ; Thornton, T.J.

  • Author_Institution
    Dept. of Electr. Eng., Arizona State Univ., Tempe, AZ, USA
  • fYear
    2002
  • fDate
    3-4 June 2002
  • Firstpage
    423
  • Lastpage
    426
  • Abstract
    Results are presented from measurements and numerical simulations of Schottky junction transistors, a new type of micropower device capable of operating at GHz frequencies in the sub-threshold regime. Detailed measurements of the DC characteristics of a 2 /spl mu/m gate length device agree well with numerical simulations. Measurements of transconductance and gate capacitance suggest that this relatively long gate length device will have a cut-off frequency of 126 MHz, which is again consistent with the numerical simulations. When projected to gate lengths of 0.1 /spl mu/m, cut-off frequencies in excess of 10 GHz are predicted for drain currents of less than 1 /spl mu/A//spl mu/m.
  • Keywords
    field effect MMIC; isolation technology; low-power electronics; microwave field effect transistors; rapid thermal annealing; silicon-on-insulator; 10 GHz; DC characteristics; SOI; Schottky barrier height; Schottky junction transistors; buried oxide layer; current gain; cutoff frequency; gate capacitance; micropower RFIC; numerical simulations; rapid thermal annealing; relatively long gate length device; subthreshold regime; transconductance; CMOS technology; Capacitance; Cutoff frequency; Frequency measurement; Length measurement; MOSFETs; Numerical simulation; Pacemakers; Radiofrequency integrated circuits; Rapid thermal annealing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radio Frequency Integrated Circuits (RFIC) Symposium, 2002 IEEE
  • Conference_Location
    Seattle, WA, USA
  • ISSN
    1529-2517
  • Print_ISBN
    0-7803-7246-8
  • Type

    conf

  • DOI
    10.1109/RFIC.2002.1012082
  • Filename
    1012082