DocumentCode :
1839509
Title :
Schottky junction transistors for micropower RFICs
Author :
Spann, J. ; Zhiyuan Wu ; Jaconelli, P. ; Jinman Yang ; Thornton, T.J.
Author_Institution :
Dept. of Electr. Eng., Arizona State Univ., Tempe, AZ, USA
fYear :
2002
fDate :
3-4 June 2002
Firstpage :
423
Lastpage :
426
Abstract :
Results are presented from measurements and numerical simulations of Schottky junction transistors, a new type of micropower device capable of operating at GHz frequencies in the sub-threshold regime. Detailed measurements of the DC characteristics of a 2 /spl mu/m gate length device agree well with numerical simulations. Measurements of transconductance and gate capacitance suggest that this relatively long gate length device will have a cut-off frequency of 126 MHz, which is again consistent with the numerical simulations. When projected to gate lengths of 0.1 /spl mu/m, cut-off frequencies in excess of 10 GHz are predicted for drain currents of less than 1 /spl mu/A//spl mu/m.
Keywords :
field effect MMIC; isolation technology; low-power electronics; microwave field effect transistors; rapid thermal annealing; silicon-on-insulator; 10 GHz; DC characteristics; SOI; Schottky barrier height; Schottky junction transistors; buried oxide layer; current gain; cutoff frequency; gate capacitance; micropower RFIC; numerical simulations; rapid thermal annealing; relatively long gate length device; subthreshold regime; transconductance; CMOS technology; Capacitance; Cutoff frequency; Frequency measurement; Length measurement; MOSFETs; Numerical simulation; Pacemakers; Radiofrequency integrated circuits; Rapid thermal annealing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Radio Frequency Integrated Circuits (RFIC) Symposium, 2002 IEEE
Conference_Location :
Seattle, WA, USA
ISSN :
1529-2517
Print_ISBN :
0-7803-7246-8
Type :
conf
DOI :
10.1109/RFIC.2002.1012082
Filename :
1012082
Link To Document :
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