• DocumentCode
    1839615
  • Title

    Effective elastic modulus of underfill material for flip-chip applications

  • Author

    Qu, Jianmin ; Wong, C.P.

  • Author_Institution
    George W. Woodruff Sch. of Mech. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
  • fYear
    1998
  • fDate
    25-28 May 1998
  • Firstpage
    848
  • Lastpage
    850
  • Abstract
    Most underfill materials are two phase composites, e.g., epoxy matrix filled with ceramic particles. The primary purpose of loading ceramic particles is to reduce the coefficient of thermal expansion (CTE) and to increase the elastic modulus. These two thermal mechanical properties are critical parameters to the thermomechanical reliability of a flip-chip package. Developing underfill materials with desired values of the CTE and elastic modulus is a key enabling technology for the next generation low-cost, high-reliability flip-chip packages. In this paper, a micromechanics model is developed to estimate the elastic modulus of underfill materials based on the properties of the matrix and the fillers. To validate the prediction from the micromechanics model, samples of underfill materials with various filler compositions are made. The moduli of these samples are measured using a Thermal Mechanical Analysis system (TMA). Satisfactory results are obtained between the theoretically predicted and experimentally measured values
  • Keywords
    elastic moduli; filled polymers; flip-chip devices; packaging; thermal expansion; ceramic particles; coefficient of thermal expansion; elastic modulus; filled epoxy matrix; flip-chip package; micromechanics model; thermal mechanical analysis; thermomechanical reliability; two phase composite; underfill material; Capacitive sensors; Ceramics; Composite materials; Fatigue; Materials science and technology; Packaging; Protection; Silicon compounds; Soldering; Thermal expansion;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components & Technology Conference, 1998. 48th IEEE
  • Conference_Location
    Seattle, WA
  • ISSN
    0569-5503
  • Print_ISBN
    0-7803-4526-6
  • Type

    conf

  • DOI
    10.1109/ECTC.1998.678806
  • Filename
    678806