Title :
The Multi-State Two-port: An Alternative Transfer Standard
Author :
Engen, Glenn F. ; Judish, Robert ; Juroshek, John
Author_Institution :
National Institute of Standards and Technology, Boulder, Colorado, 80303
Abstract :
In a companion paper [1] the proposed use of a ¿stable solid state programmable impedance generator¿ as a calibration transfer and verification standard, for vector network analyzers, (VNA) has been suggested. An obvious requirement is that the multi-state device provide a high degree of stability and repeatability. This paper describes a series of preliminary tests, using the NIST six-port systems, to evaluate the parameters of interest. The application of this device in connector evaluation is also reported.
Keywords :
Calibration; Connectors; Frequency; Impedance; Microwave devices; NIST; Paper technology; Reflection; Solid state circuits; Statistical analysis;
Conference_Titel :
ARFTG Conference Digest-Spring, 43rd
Conference_Location :
San Diego, CA, USA
Print_ISBN :
0-7803-5686-1
DOI :
10.1109/ARFTG.1994.327053
