DocumentCode :
1840003
Title :
Enhancing moisture resistance of PBGA
Author :
Teo, Yong Chua ; Wong, Ee Hua ; Lim, Thiam Beng ; Yang, Yu Chuan ; Ju, Jin Han
Author_Institution :
Inst. of Microelectron., Singapore
fYear :
1998
fDate :
25-28 May 1998
Firstpage :
930
Lastpage :
935
Abstract :
One of the main package reliability limitations of PBGA is its moisture sensitivity performance, i.e. popcorn failure. The objective of this work is to enhance the moisture resistance of a 35×35 mm overmolded PBGA by matching its material combination. The approach taken is to correlate the package moisture sensitivity performance with the packaging material properties. JEDEC level 2 moisture sensitivity performance was achieved with two different combinations of materials. The best combination was close to achieving level 1 performance, thereby reinforcing the importance of material matching. Mold compound moisture absorption property has the strongest correlation with package moisture performance. A low value is favourable. For die attach material, the hot and wet adhesion shear strength showed the strongest correlation with package moisture performance. High adhesion shear strength is preferred. Unlike mold compound, the moisture absorption property of die attach material has a significantly weaker correlation
Keywords :
adhesion; environmental degradation; failure analysis; moisture; plastic packaging; reliability; shear strength; JEDEC level 2; PBGA; adhesion shear strength; die attach; material matching; moisture resistance; mold compound; package reliability; popcorn failure; Absorption; Adhesives; Components, packaging, and manufacturing technology; Material properties; Microassembly; Microelectronics; Moisture; Plastic packaging; Substrates; Thermal stresses;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components & Technology Conference, 1998. 48th IEEE
Conference_Location :
Seattle, WA
ISSN :
0569-5503
Print_ISBN :
0-7803-4526-6
Type :
conf
DOI :
10.1109/ECTC.1998.678820
Filename :
678820
Link To Document :
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