• DocumentCode
    1840003
  • Title

    Enhancing moisture resistance of PBGA

  • Author

    Teo, Yong Chua ; Wong, Ee Hua ; Lim, Thiam Beng ; Yang, Yu Chuan ; Ju, Jin Han

  • Author_Institution
    Inst. of Microelectron., Singapore
  • fYear
    1998
  • fDate
    25-28 May 1998
  • Firstpage
    930
  • Lastpage
    935
  • Abstract
    One of the main package reliability limitations of PBGA is its moisture sensitivity performance, i.e. popcorn failure. The objective of this work is to enhance the moisture resistance of a 35×35 mm overmolded PBGA by matching its material combination. The approach taken is to correlate the package moisture sensitivity performance with the packaging material properties. JEDEC level 2 moisture sensitivity performance was achieved with two different combinations of materials. The best combination was close to achieving level 1 performance, thereby reinforcing the importance of material matching. Mold compound moisture absorption property has the strongest correlation with package moisture performance. A low value is favourable. For die attach material, the hot and wet adhesion shear strength showed the strongest correlation with package moisture performance. High adhesion shear strength is preferred. Unlike mold compound, the moisture absorption property of die attach material has a significantly weaker correlation
  • Keywords
    adhesion; environmental degradation; failure analysis; moisture; plastic packaging; reliability; shear strength; JEDEC level 2; PBGA; adhesion shear strength; die attach; material matching; moisture resistance; mold compound; package reliability; popcorn failure; Absorption; Adhesives; Components, packaging, and manufacturing technology; Material properties; Microassembly; Microelectronics; Moisture; Plastic packaging; Substrates; Thermal stresses;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components & Technology Conference, 1998. 48th IEEE
  • Conference_Location
    Seattle, WA
  • ISSN
    0569-5503
  • Print_ISBN
    0-7803-4526-6
  • Type

    conf

  • DOI
    10.1109/ECTC.1998.678820
  • Filename
    678820