Title :
Advanced ESD tool flow, testing and design verification results
Author :
Palmer, Nicholas ; Muhammad, Mujahid ; Mitra, Souvick ; Montstream, James ; Gauthier, Robert
Author_Institution :
IBM, Essex Junction, VT, USA
Abstract :
ESD verification has become increasingly complex as integrated circuits move towards system-on-chip (SOC) applications. The result of this is that newer ESD specific checking techniques are required. This paper describes the ESD checking flow of these tools, the testing of them, and the real design errors they have uncovered.
Keywords :
electrostatic discharge; integrated circuit design; integrated circuit testing; system-on-chip; ESD specific checking techniques; ESD verification; SoC; advanced ESD tool flow; integrated circuits; system-on-chip; Color; Current density; Electrostatic discharges; Layout; Metals; Shape; Testing;
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2012 34th
Conference_Location :
Tucson, AZ
Print_ISBN :
978-1-4673-1467-1
