Title : 
A locally matching technique for broadband flip-chip transition design
         
        
            Author : 
Chun-Long Wang ; Ruey-Beei Wu
         
        
            Author_Institution : 
Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
         
        
        
        
        
        
            Abstract : 
A locally matching technique is proposed in this paper to improve the wideband performance of a flip-chip transition. The gap width of the CPW line in the flip-chip bump pad region is enlarged for achieving larger inductance to compensate for the capacitance at the transition, making the approximate impedance close to 50 /spl Omega/. An equivalent circuit is derived from the frequency response of the transition simulated by Sonnet and is used to control the resonance frequency of the structure. With a properly chosen value of the enlarged width, the resonant dip can be controlled to improve return loss over a band from DC to 60 GHz. Measurement data of the scaled structure is in good agreement with the simulation results, which validates the proposed design idea.
         
        
            Keywords : 
capacitance; compensation; coplanar waveguides; equivalent circuits; flip-chip devices; frequency response; hybrid integrated circuits; inductance; integrated circuit interconnections; microwave integrated circuits; millimetre wave integrated circuits; multichip modules; resonance; 0 to 60 GHz; CPW line; MCM; MIC; MM-wave ICs; Sonnet; broadband flip-chip transition design; capacitance compensation; equivalent circuit; flip-chip bump pad region; frequency response; gap width enlargement; inductance; locally matching technique; resonance frequency control; resonant dip control; return loss improvement; wideband performance; Capacitance; Circuit simulation; Coplanar waveguides; Equivalent circuits; Frequency response; Impedance; Inductance; Resonance; Resonant frequency; Wideband;
         
        
        
        
            Conference_Titel : 
Microwave Symposium Digest, 2002 IEEE MTT-S International
         
        
            Conference_Location : 
Seattle, WA, USA
         
        
        
            Print_ISBN : 
0-7803-7239-5
         
        
        
            DOI : 
10.1109/MWSYM.2002.1012116