DocumentCode :
1840308
Title :
Minimizing electrostatic charge generation and ESD event in TFT-LCD production equipment
Author :
Kim, Dong-Sun ; Lim, Chun-Bae ; Oh, Du-Seok ; Ho, Won-Joon ; Jeong, Ju-Young ; Park, Byeong-Hoo ; Kim, Tae-Young ; Suh, Kwang S.
Author_Institution :
Manuf. Technol. Center, LG Display, Paju, South Korea
fYear :
2012
fDate :
9-14 Sept. 2012
Firstpage :
1
Lastpage :
6
Abstract :
This paper reports the results of investigations into electrostatic charging effects of a separation between glass and stage in TFT LCD manufacturing process. Generated electrostatic charge is closely related with vacuum pressure to hold the glass, holding times, separation cycles, and lift pin up height/speed. Therefore, effects on these factors are studied and a correlation between ESD damage and lift pin materials is analyzed. To avoid ESD damage and to minimize the charge generation during separation process, we suggest that the optimization of process condition and materials are required in addition to grounding and ionization.
Keywords :
electrostatic discharge; ionisation; liquid crystal displays; manufacturing processes; thin film transistors; ESD damage; ESD event; TFT LCD manufacturing process; TFT-LCD production equipment; electrostatic charge generation; electrostatic charging effects; ionization; lift pin materials; process condition optimization; separation process; vacuum pressure; Electrostatic discharges; Glass; Metals; Surface charging; Surface resistance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2012 34th
Conference_Location :
Tucson, AZ
ISSN :
0739-5159
Print_ISBN :
978-1-4673-1467-1
Type :
conf
Filename :
6333291
Link To Document :
بازگشت