Title :
Accurate Determination of the Impedance Profile Using Enhanced Accuracy Time Domain Reflection and Transmission Measurements
Author :
Smolyansky, Dmitry A. ; Diamond, Scott K. ; Tripathi, Vijai K.
Author_Institution :
Measurement Division, Tektronix, Inc., P.O. Box 500, M/S 19-999, Beaverton, OR 97077, phone (503) 627-2322, fax (503) 627-2260
Abstract :
A method of determining the impedance profile of transmission structures with high accuracy is presented. It employs frequency domain error correction and reconstruction of the original time domain data. This method is particularly useful for extracting the equivalent circuit model of the interconnects in the ICs and IC packages, which require high precision time domain reflection and transmission measurements.
Keywords :
Data mining; Equivalent circuits; Error correction; Frequency domain analysis; Impedance measurement; Integrated circuit interconnections; Integrated circuit modeling; Integrated circuit packaging; Particle measurements; Time measurement;
Conference_Titel :
ARFTG Conference Digest-Fall, 44th
Conference_Location :
Boulder, CO, USA
Print_ISBN :
0-7803-5686-1
DOI :
10.1109/ARFTG.1994.327081
