• DocumentCode
    1840346
  • Title

    Accurate Determination of the Impedance Profile Using Enhanced Accuracy Time Domain Reflection and Transmission Measurements

  • Author

    Smolyansky, Dmitry A. ; Diamond, Scott K. ; Tripathi, Vijai K.

  • Author_Institution
    Measurement Division, Tektronix, Inc., P.O. Box 500, M/S 19-999, Beaverton, OR 97077, phone (503) 627-2322, fax (503) 627-2260
  • Volume
    26
  • fYear
    1994
  • fDate
    Dec. 1994
  • Firstpage
    56
  • Lastpage
    62
  • Abstract
    A method of determining the impedance profile of transmission structures with high accuracy is presented. It employs frequency domain error correction and reconstruction of the original time domain data. This method is particularly useful for extracting the equivalent circuit model of the interconnects in the ICs and IC packages, which require high precision time domain reflection and transmission measurements.
  • Keywords
    Data mining; Equivalent circuits; Error correction; Frequency domain analysis; Impedance measurement; Integrated circuit interconnections; Integrated circuit modeling; Integrated circuit packaging; Particle measurements; Time measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ARFTG Conference Digest-Fall, 44th
  • Conference_Location
    Boulder, CO, USA
  • Print_ISBN
    0-7803-5686-1
  • Type

    conf

  • DOI
    10.1109/ARFTG.1994.327081
  • Filename
    4119756
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1840346