• DocumentCode
    1840385
  • Title

    Development of low cost, low temperature conductive adhesives

  • Author

    Kang, Sung K. ; Purushothaman, S.

  • Author_Institution
    Res. Div., IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
  • fYear
    1998
  • fDate
    25-28 May 1998
  • Firstpage
    1031
  • Lastpage
    1035
  • Abstract
    Electrically and/or thermally conductive materials comprising metallic filler particles and polymer matrix have been actively investigated as replacements for the solder interconnections used in microelectronic applications. Silver-filled epoxy resin materials originally developed for thermal conduction in die attach applications have been candidates for this purpose. However, several limitations have been realized when they are considered as a replacement for solder interconnections, such as low electrical conductivity, low joint strength, increase in contact resistance upon thermal cycling, lack of reworkability, and silver migration. In order to overcome these limitations, a new formulation has been developed based on alternative high conducting filler particles and tailored polymer resins. The high conducting filler particles are coated with low melting point, non-toxic metals or alloys which can be fused to achieve metallurgical bonding between adjacent particles as well as particles to the substrate contacts. Specifically, an electrically conductive adhesive made of Sn-coated Cu powder and polyimide-siloxane resin was developed, and their salient properties were reported previously. This material is a good candidate for the high temperature solder joints such as controlled collapse chip connection (C4) and solder ball connection (SEC) to a ceramic substrate, but not for the polymeric printed circuit board applications
  • Keywords
    adhesives; conducting materials; filled polymers; Cu-Sn; Sn-coated Cu powder; ceramic substrate; controlled collapse chip connection; die attach; low melting point nontoxic metal coating; low temperature conductive adhesive; metallic filler particles; metallurgical bonding; microelectronic packaging; polyimide-siloxane resin; polymer matrix; solder ball connection; Conducting materials; Conductive adhesives; Costs; Inorganic materials; Integrated circuit interconnections; Polymers; Resins; Temperature; Thermal conductivity; Transmission line matrix methods;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components & Technology Conference, 1998. 48th IEEE
  • Conference_Location
    Seattle, WA
  • ISSN
    0569-5503
  • Print_ISBN
    0-7803-4526-6
  • Type

    conf

  • DOI
    10.1109/ECTC.1998.678840
  • Filename
    678840