Title :
Response of canonical ports to a high power electromagnetic excitation
Author :
Mora, N. ; Vega, F. ; Rachidi, F. ; Nyffeler, M.
Author_Institution :
EMC Lab., Swiss Fed. Inst. of Technol.-EPFL, Lausanne, Switzerland
Abstract :
In this work, we present a methodology to calculate the required electromagnetic environment to achieve the maximization of the thermal response of a canonical port of interest (mainly electronic components) in order to achieve permanent damage. The |E2| τ product (E being the amplitude of the impinging electric field and τ the duration of the illumination) is shown to be the key parameter to define the required electromagnetic environment that could lead to the thermal destruction. Application examples with canonical incident waveforms are presented and discussed.
Keywords :
electromagnetic wave propagation; optimisation; canonical incident waveforms; canonical ports; electronic components; high power electromagnetic excitation; thermal destruction; thermal response maximization; Electric fields; Electromagnetic compatibility; Electronic components; Impedance; Transfer functions; Transistors;
Conference_Titel :
Electromagnetics in Advanced Applications (ICEAA), 2011 International Conference on
Conference_Location :
Torino
Print_ISBN :
978-1-61284-976-8
DOI :
10.1109/ICEAA.2011.6046473