Title :
ESD protection of MR sensors using a dissipative shunt
Author :
Iben, Icko Eric Timothy ; Boday, Dylan ; Bandy, William ; Gentrup, Gene ; Lam, Michelle ; Paniagua, Guillermo F.
Author_Institution :
Tape Head Dev. Group, IBM Corp., San Jose, CA, USA
Abstract :
Cabled Magnetoresistive sensors (CMODs) can be damaged during manufacturing assembly when the CMOD voltage and the device to which they are connected have voltage differentials below about 25 V. This paper discusses the use of a dissipative shunt built into the CMOD to dissipate potential ESD charges.
Keywords :
electrostatic discharge; magnetic sensors; magnetoresistive devices; CMOD voltage; ESD protection; MR sensors; cabled magnetoresistive sensors; dissipative shunt; manufacturing assembly; potential ESD charge dissipation; Carbon; Electrostatic discharges; Joining processes; Magnetic sensors; Materials; Resistance;
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2012 34th
Conference_Location :
Tucson, AZ
Print_ISBN :
978-1-4673-1467-1
