DocumentCode :
1840471
Title :
A novel flip chip technology using non-conductive resin sheet
Author :
Ito, Satoshi ; Mizutani, Masaki ; Noro, Hiroshi ; Kuwamura, Makoto ; Prabhu, Ashok
Author_Institution :
Nitto Denko Corp., Mie, Japan
fYear :
1998
fDate :
25-28 May 1998
Firstpage :
1047
Lastpage :
1051
Abstract :
A novel flip chip packaging technology using non-conductive resin sheet has been studied. The process flow of this new packaging system is as follows. First, epoxy base resin sheet is laminated onto substrate to cover the substrate surface including land electrodes. Bumped chip alignment and attachment has done through the resin sheet, in the second stage with pressure and temperature. The bumps under the chip penetrate with removing resin sheet material and eventually reaching to the metal land of the substrate in this process. Metal connection and curing of the interface resin have completed in the third stage. This new process has big potential to make flip chip package simple compared with current flip chip packaging process using liquid resin with dispensing system. The through put time can be reduced to less than 10 seconds/units in actual model case even large flip chip package which has over 15×15 (mm) square area IC chip. The other advantages are thermal stability of material in the process, moisture related performance, and warpage control performance. For current underfill process we have only choice to use anhydride type resin system which has many disadvantaged on that. This new process made it possible to introduce moisture and thermally stable epoxy resin with phenol curing system for flip chip packaging. Drastic process ability improvement can be achieved by the new process and material. As a typical improvement of thermal shock performance, it was confirmed that the life of chip damage becomes over 10 times longer by flip chip bonding parameters which can be controlled only by this new flip chip packaging process
Keywords :
flip-chip devices; integrated circuit packaging; laminates; polymers; thermal stability; IC packaging; bumped chip alignment; flip chip technology; laminated epoxy resin; land electrode; metal connection; moisture; nonconductive resin sheet; phenol curing; thermal shock; thermal stability; underfill process; warpage control; Curing; Electrodes; Flip chip; Integrated circuit modeling; Land surface; Land surface temperature; Moisture; Packaging; Resins; Sheet materials;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components & Technology Conference, 1998. 48th IEEE
Conference_Location :
Seattle, WA
ISSN :
0569-5503
Print_ISBN :
0-7803-4526-6
Type :
conf
DOI :
10.1109/ECTC.1998.678843
Filename :
678843
Link To Document :
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