1840476

Characterization of transistor mismatch for statistical CAD of submicron CMOS analog circuits

Michael, C. ; Ismail, Mahamod ; Teng, C.S. ; Lahri, R.

1993

3-6 May 1993

1401

1404

Analog circuits; CMOS analog integrated circuits; Current measurement; Drives; Guidelines; Integrated circuit measurements; MOS devices; MOSFETs; Predictive models; Random processes;

English

ieee

Circuits and Systems, 1993., ISCAS '93, 1993 IEEE International Symposium on

IEEE

0-7803-1281-3

conf

692917