Novel beam scanning technique for circularly-polarized reflector antennas

This paper introduces a new technique for scanning circularly-polarized (CP) beams in reflector antennas. The technique explores the intrinsic properties associated with crosspolarization (XPOL) and beam squint in offset parabolic reflectors. Furthermore the beams are scanned while keeping the whole reflector system focused throughout the scanning process, thus reducing degradations commonly encountered in other procedures. Preliminary numerical results indicate the viability of the proposed procedure over limited scan regions (e.g., /spl plusmn/2/spl deg/), which suggests its use in space applications.