DocumentCode :
1840576
Title :
S-Parameter Test Set for Pulsed Networks
Author :
Regan, A.H. ; Ziomek, C.D. ; Brooks, T.R.
Author_Institution :
LOS ALAMOS NATIONAL LABORATORY
Volume :
26
fYear :
1994
fDate :
1-2 Dec. 1994
Firstpage :
105
Lastpage :
111
Abstract :
A scattering parameter test set that operates in a pulsed mode for analyzing RF/microwave networks has been developed. Designed for analyzing various components of accelerator RF systems, the test set is applicable to a variety of components at different frequencies. The test set consists of an embedded processor, a tracking downconverter, a dual channel vector detector, a timing distribution module, a pulse generator, and a signal generator. The majority of the hardware is packaged in the modular VXIbus architecture, and the control software is National Instruments´ LabVIEWO. Measurements of systems have been made centered around 425 MHz, 850 MHz and 1300 MHz, although other frequency regimes are available. This test set sweeps frequency and amplitude levels while measuring the in-phase and quadrature components of the incident, reflected, and transmitted signals.
Keywords :
Control systems; Detectors; Frequency measurement; High power amplifiers; Pulse amplifiers; Pulse generation; Radio frequency; Scattering parameters; Signal generators; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
ARFTG Conference Digest-Fall, 44th
Conference_Location :
Boulder, CO, USA
Print_ISBN :
0-7803-5686-1
Type :
conf
DOI :
10.1109/ARFTG.1994.327087
Filename :
4119762
Link To Document :
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