DocumentCode
1840605
Title
The QUEST System in Intel Fab18: a web-based method for the management of quality
Author
Kaplan, Yael
Author_Institution
Intel Corp., Qiryat Gat, Israel
fYear
2001
fDate
2001
Firstpage
433
Lastpage
434
Abstract
The QUEST System provides a web-based platform for the standardized management, tracking and assessment of quality excursion events across an entire Fab. The system has become the pivot of Intel Corporation Fab18´s quality excursion event management and is now in the process of implementation in other factories
Keywords
manufacturing data processing; quality management; semiconductor device manufacture; Intel Fab18; QUEST System; quality management; semiconductor manufacturing; web-based method; Circuits; Content management; Frequency; Impedance; Manufacturing; Pareto analysis; Postal services; Production facilities; Quality management; Relays;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Manufacturing Symposium, 2001 IEEE International
Conference_Location
San Jose, CA
Print_ISBN
0-7803-6731-6
Type
conf
DOI
10.1109/ISSM.2001.963008
Filename
963008
Link To Document