• DocumentCode
    1840703
  • Title

    pFSB technology enables field programmability in an ASIC environment

  • Author

    Coli, Vincent J. ; Lipman, Jim

  • Author_Institution
    VLSI Technology Inc., San Jose, CA, USA
  • fYear
    1993
  • fDate
    22-26 Feb. 1993
  • Firstpage
    385
  • Lastpage
    389
  • Abstract
    Describes pFSB (programmable functional system blocks) technology and cells, a field-programmable capability based on ViaLink antifuse technology that can be embedded in an ASIC chip. Fully compatible with existing high-speed ASIC processing, library cells, compilers, and design tools, pFSB cells give the user an extension of traditional ASIC technology that provides for additional value in both ASIC- and ASSP (application specific signal processor) based systems. Chips using pFSB structures, as memory, logic, or customized elements, give the designer the ability to make last-minute decisions in product design, as well as allowing the security of designs to be easily implemented. The availability of comprehensive testing and programming hardware and software results in a user environment for chips using pFSB cells that is both friendly and easily implemented. The authors present a description of the ViaLink programming element, a description of pFSB cells and how they are used, and a summary of design methodology, testing, and programming considerations.<>
  • Keywords
    application specific integrated circuits; circuit CAD; integrated circuit technology; integrated circuit testing; logic arrays; ASIC environment; ASSP based systems; FPGA; ViaLink antifuse technology; ViaLink programming element; application specific signal processor; compilers; customized elements; design tools; field programmability; library cells; logic elements; memory elements; pFSB cells; pFSB technology; programmable functional system blocks; programming hardware; security; testing; user friendly environment; Application software; Application specific integrated circuits; Libraries; Logic design; Logic programming; Product design; Security; Signal design; Signal processing; Software testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Compcon Spring '93, Digest of Papers.
  • Conference_Location
    San Francisco, CA, USA
  • Print_ISBN
    0-8186-3400-6
  • Type

    conf

  • DOI
    10.1109/CMPCON.1993.289701
  • Filename
    289701