Title :
pFSB technology enables field programmability in an ASIC environment
Author :
Coli, Vincent J. ; Lipman, Jim
Author_Institution :
VLSI Technology Inc., San Jose, CA, USA
Abstract :
Describes pFSB (programmable functional system blocks) technology and cells, a field-programmable capability based on ViaLink antifuse technology that can be embedded in an ASIC chip. Fully compatible with existing high-speed ASIC processing, library cells, compilers, and design tools, pFSB cells give the user an extension of traditional ASIC technology that provides for additional value in both ASIC- and ASSP (application specific signal processor) based systems. Chips using pFSB structures, as memory, logic, or customized elements, give the designer the ability to make last-minute decisions in product design, as well as allowing the security of designs to be easily implemented. The availability of comprehensive testing and programming hardware and software results in a user environment for chips using pFSB cells that is both friendly and easily implemented. The authors present a description of the ViaLink programming element, a description of pFSB cells and how they are used, and a summary of design methodology, testing, and programming considerations.<>
Keywords :
application specific integrated circuits; circuit CAD; integrated circuit technology; integrated circuit testing; logic arrays; ASIC environment; ASSP based systems; FPGA; ViaLink antifuse technology; ViaLink programming element; application specific signal processor; compilers; customized elements; design tools; field programmability; library cells; logic elements; memory elements; pFSB cells; pFSB technology; programmable functional system blocks; programming hardware; security; testing; user friendly environment; Application software; Application specific integrated circuits; Libraries; Logic design; Logic programming; Product design; Security; Signal design; Signal processing; Software testing;
Conference_Titel :
Compcon Spring '93, Digest of Papers.
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-8186-3400-6
DOI :
10.1109/CMPCON.1993.289701