DocumentCode :
1840745
Title :
Comparison of the shear strength and reliability between gold-plated and bare copper lands of a BGA package
Author :
Lee, C.H. ; Lee, S.G. ; Moon, B.H.
Author_Institution :
R&D Center, Anam Semicond. Inc., Seoul, South Korea
fYear :
1998
fDate :
25-28 May 1998
Firstpage :
1103
Lastpage :
1108
Abstract :
In this study, we focus on the possibility that the land of bare copper in plastic ball grid array (PBGA hereafter) packages may be used instead of the gold-plated land. Comparison of the shear strength of the balls on the two types of the land is made every 100 cycles of the temperature cycling test. The result shows that the shear strength of bare copper lands with oxidization during the standard process of PBGA is almost as comparable as that of gold-plated lands within experimental error range. Surface analysis of the lands before ball attachment and after ball detachment is presented. A possible process development using copper wire is suggested
Keywords :
ball grid arrays; copper; gold; oxidation; plastic packaging; reliability; shear strength; Cu; Cu-Au; bare copper land; gold-plated copper land; oxidization; plastic ball grid array package; reliability; shear strength; surface analysis; temperature cycling; Bonding; Copper; Gold; Lead; Plastic packaging; Semiconductor device packaging; Soldering; Temperature; Testing; Wire;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components & Technology Conference, 1998. 48th IEEE
Conference_Location :
Seattle, WA
ISSN :
0569-5503
Print_ISBN :
0-7803-4526-6
Type :
conf
DOI :
10.1109/ECTC.1998.678852
Filename :
678852
Link To Document :
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