• DocumentCode
    1840831
  • Title

    Throughput improvement in photolithography processing for flexible production

  • Author

    Yajima, Shigeyuki ; Nakano, Takashi ; Sadachi, Kazunori ; Ikura, Yoshiaki ; Miura, Hajime ; Tomozawa, Akihiro

  • Author_Institution
    Hitachi Tohbu Semicond. Ltd, Gunma, Japan
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    459
  • Lastpage
    462
  • Abstract
    During the drastic product change from memory devices to discrete devices, we have made various technical improvements in photolithography processing corresponding to its design characteristics, as follows: (1) establishment of fine gate processing technology; (2) optimization of throughput and processing accuracy using new photoresist processing customized for each step; and (3) establishment of flexible stepper application methods aimed at products-change-free production. Consequently, we have obtained the following beneficial results: (1) processing of 0.25 μm discrete devices has been set up without KrF lithography; (2) a 198% improvement in stepper throughput has been achieved; and (3) a 58% reduction of waiting time has been obtained
  • Keywords
    flexible manufacturing systems; integrated circuit manufacture; photolithography; 0.25 micron; design characteristics; fine gate processing technology; flexible production; flexible stepper application methods; photolithography processing; processing accuracy; products-change-free production; stepper throughput; waiting time; Design optimization; Image communication; Lithography; MOS devices; Mass production; Optimized production technology; Resists; Shape; Space technology; Throughput;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Manufacturing Symposium, 2001 IEEE International
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    0-7803-6731-6
  • Type

    conf

  • DOI
    10.1109/ISSM.2001.963015
  • Filename
    963015