DocumentCode
1840831
Title
Throughput improvement in photolithography processing for flexible production
Author
Yajima, Shigeyuki ; Nakano, Takashi ; Sadachi, Kazunori ; Ikura, Yoshiaki ; Miura, Hajime ; Tomozawa, Akihiro
Author_Institution
Hitachi Tohbu Semicond. Ltd, Gunma, Japan
fYear
2001
fDate
2001
Firstpage
459
Lastpage
462
Abstract
During the drastic product change from memory devices to discrete devices, we have made various technical improvements in photolithography processing corresponding to its design characteristics, as follows: (1) establishment of fine gate processing technology; (2) optimization of throughput and processing accuracy using new photoresist processing customized for each step; and (3) establishment of flexible stepper application methods aimed at products-change-free production. Consequently, we have obtained the following beneficial results: (1) processing of 0.25 μm discrete devices has been set up without KrF lithography; (2) a 198% improvement in stepper throughput has been achieved; and (3) a 58% reduction of waiting time has been obtained
Keywords
flexible manufacturing systems; integrated circuit manufacture; photolithography; 0.25 micron; design characteristics; fine gate processing technology; flexible production; flexible stepper application methods; photolithography processing; processing accuracy; products-change-free production; stepper throughput; waiting time; Design optimization; Image communication; Lithography; MOS devices; Mass production; Optimized production technology; Resists; Shape; Space technology; Throughput;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Manufacturing Symposium, 2001 IEEE International
Conference_Location
San Jose, CA
Print_ISBN
0-7803-6731-6
Type
conf
DOI
10.1109/ISSM.2001.963015
Filename
963015
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