DocumentCode :
1840831
Title :
Throughput improvement in photolithography processing for flexible production
Author :
Yajima, Shigeyuki ; Nakano, Takashi ; Sadachi, Kazunori ; Ikura, Yoshiaki ; Miura, Hajime ; Tomozawa, Akihiro
Author_Institution :
Hitachi Tohbu Semicond. Ltd, Gunma, Japan
fYear :
2001
fDate :
2001
Firstpage :
459
Lastpage :
462
Abstract :
During the drastic product change from memory devices to discrete devices, we have made various technical improvements in photolithography processing corresponding to its design characteristics, as follows: (1) establishment of fine gate processing technology; (2) optimization of throughput and processing accuracy using new photoresist processing customized for each step; and (3) establishment of flexible stepper application methods aimed at products-change-free production. Consequently, we have obtained the following beneficial results: (1) processing of 0.25 μm discrete devices has been set up without KrF lithography; (2) a 198% improvement in stepper throughput has been achieved; and (3) a 58% reduction of waiting time has been obtained
Keywords :
flexible manufacturing systems; integrated circuit manufacture; photolithography; 0.25 micron; design characteristics; fine gate processing technology; flexible production; flexible stepper application methods; photolithography processing; processing accuracy; products-change-free production; stepper throughput; waiting time; Design optimization; Image communication; Lithography; MOS devices; Mass production; Optimized production technology; Resists; Shape; Space technology; Throughput;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Manufacturing Symposium, 2001 IEEE International
Conference_Location :
San Jose, CA
Print_ISBN :
0-7803-6731-6
Type :
conf
DOI :
10.1109/ISSM.2001.963015
Filename :
963015
Link To Document :
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