Test Coverage Optimization for Large Code Problems

Author

Lin, Ying-Dar ; Chou, Chi-Heng ; Lai, Yuan-Cheng ; Huang, Tse-Yau ; Chung, Simon ; Hung, Jui-Tsun ; Lin, Frank C.

Author_Institution

Dept. of Comput. Sci., Nat. Chiao Tung Univ., Hsinchu, Taiwan

fYear

2012

fDate

26-29 March 2012

Firstpage

215

Lastpage

220

Abstract

Because running all previous tests for the regression testing of a system is time-consuming, the size of a test suite of the system must be reduced intelligently with adequate test coverage and without compromising its fault detection capability. Five algorithms were designed for reducing the size of test suites where two metrics, test´s function reach ability and function´s test intensity, were defined. Approaches to the algorithm CW-NumMin, CW-CostMin, or CW-CostCov-B are the safe-mode of test case selection with full-modified function coverage, while the CW-CovMax algorithm is of non-safe mode, which was performed under time restriction. In this study, the most efficient algorithm could reduce the cost (time) of a test suite down to 1.10%, on the average, over the MPLS area of Cisco IOS.

Keywords

program testing; regression analysis; statistical testing; CW-CostCov-B algorithm; CW-CostMin algorithm; CW-CovMax algorithm; CW-NumMin algorithm; fault detection; large code problems; regression testing; test case selection; test coverage optimization; test suite; Algorithm design and analysis; Databases; Educational institutions; Electronic mail; Fault detection; Multiprotocol label switching; Testing; function reachability; regression testing; test case selection; test coverage; test intensity;

fLanguage

English

Publisher

ieee

Conference_Titel

Advanced Information Networking and Applications Workshops (WAINA), 2012 26th International Conference on

Conference_Location

Fukuoka

Print_ISBN

978-1-4673-0867-0

Type

conf

DOI

10.1109/WAINA.2012.137

Filename

6185125