• DocumentCode
    1840858
  • Title

    System failures due to an induced ESD within the system

  • Author

    Isofuku, Satoshi ; Honda, Masamitsu

  • Author_Institution
    Tokyo Electron. Trading Co., Ltd., Tachikawa, Japan
  • fYear
    2012
  • fDate
    9-14 Sept. 2012
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    This paper reports the experimental analysis of charge induction phenomena on floating metals in an electronic system caused by walking charged human an EMI (Electromagnetic interference) on electronic circuit including system failure analysis due to a small gap discharge which is called “induced ESD”.
  • Keywords
    electromagnetic induction; electromagnetic interference; electrostatic discharge; failure analysis; EMI; charge induction phenomena; electromagnetic interference; electronic circuit; electronic system; failure analysis; floating metals; induced ESD; small gap discharge; system failures; walking charged human; Cable shielding; Copper; Discharges (electric); Electrostatic discharges; Impedance; Noise;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2012 34th
  • Conference_Location
    Tucson, AZ
  • ISSN
    0739-5159
  • Print_ISBN
    978-1-4673-1467-1
  • Type

    conf

  • Filename
    6333314
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1840858