DocumentCode :
1840919
Title :
A New Measurement Method for Determination of Transistor Parameters
Author :
Chenakin, Alexunder V.
Author_Institution :
Kiev Polytechnic Institute, Kiev, Ukraine
Volume :
27
fYear :
1995
fDate :
34820
Firstpage :
12
Lastpage :
18
Abstract :
A new measurement method for determination of transistor parameters on millimeter waves is proposed. Technique for calculation and design of the special measurement section was developed.
Keywords :
Chebyshev approximation; Electromagnetic waveguides; Impedance measurement; Measurement standards; Millimeter wave measurements; Millimeter wave technology; Millimeter wave transistors; Rectangular waveguides; Transmission line measurements; Transmission line theory;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
ARFTG Conference Digest-Spring, 45th
Conference_Location :
Orlando, FL, USA
Print_ISBN :
0-7803-5686-1
Type :
conf
DOI :
10.1109/ARFTG.1995.327100
Filename :
4119777
Link To Document :
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