Title :
Energy saving in semiconductor fabs by using vacuum insulator
Author :
Ohmura, Takahiro ; Wadasako, Mitsushi ; Suenaga, Osamu ; Ohta, Tomohiro ; Ohmi, Tadahiro ; Sugawa, Shigetoshi
Author_Institution :
Nichias Corp., Shizuoka, Japan
Abstract :
This paper describes the heat insulation of newly developed vacuum insulators of vertical furnaces for 300 mm silicon wafer oxidation process. The thermal conductivities of several core materials at low vacuum (0.1 Pa) were shown to be about 1/3 of those measured at atmospheric pressure. The new insulator consists of a metal casing and a core material of heat resistant type that is enclosed in the former tightly enough to maintain the vacuum state once established. The amount of heat radiation from the vertical furnace equipped with the vacuum insulator thus developed is experimentally found to be less than 1/4 of the conventional system. This means that the amount of energy transfer to clean room air could be reduced to less than 1/4 that of the present casing by employment of the vacuum insulator packed with the core materials
Keywords :
cooling; furnaces; heat radiation; integrated circuit manufacture; oxidation; silicon; thermal conductivity; thermal insulation; vacuum insulation; 0.1 Pa; 300 mm; Si; Si wafer oxidation process; SiO2-Si; cooling cost; core materials; cyclic heat method; energy saving; energy transfer reduction; heat insulation; heat radiation; metal casing; semiconductor fabrication facilities; semiconductor fabs; semiconductor processing machines; thermal conductivities; vacuum insulators; vertical furnaces; Atmospheric measurements; Conducting materials; Conductivity measurement; Elementary particle vacuum; Furnaces; Insulation; Oxidation; Semiconductor materials; Silicon; Thermal conductivity;
Conference_Titel :
Semiconductor Manufacturing Symposium, 2001 IEEE International
Conference_Location :
San Jose, CA
Print_ISBN :
0-7803-6731-6
DOI :
10.1109/ISSM.2001.963019