• DocumentCode
    1840945
  • Title

    Energy saving in semiconductor fabs by using vacuum insulator

  • Author

    Ohmura, Takahiro ; Wadasako, Mitsushi ; Suenaga, Osamu ; Ohta, Tomohiro ; Ohmi, Tadahiro ; Sugawa, Shigetoshi

  • Author_Institution
    Nichias Corp., Shizuoka, Japan
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    477
  • Lastpage
    480
  • Abstract
    This paper describes the heat insulation of newly developed vacuum insulators of vertical furnaces for 300 mm silicon wafer oxidation process. The thermal conductivities of several core materials at low vacuum (0.1 Pa) were shown to be about 1/3 of those measured at atmospheric pressure. The new insulator consists of a metal casing and a core material of heat resistant type that is enclosed in the former tightly enough to maintain the vacuum state once established. The amount of heat radiation from the vertical furnace equipped with the vacuum insulator thus developed is experimentally found to be less than 1/4 of the conventional system. This means that the amount of energy transfer to clean room air could be reduced to less than 1/4 that of the present casing by employment of the vacuum insulator packed with the core materials
  • Keywords
    cooling; furnaces; heat radiation; integrated circuit manufacture; oxidation; silicon; thermal conductivity; thermal insulation; vacuum insulation; 0.1 Pa; 300 mm; Si; Si wafer oxidation process; SiO2-Si; cooling cost; core materials; cyclic heat method; energy saving; energy transfer reduction; heat insulation; heat radiation; metal casing; semiconductor fabrication facilities; semiconductor fabs; semiconductor processing machines; thermal conductivities; vacuum insulators; vertical furnaces; Atmospheric measurements; Conducting materials; Conductivity measurement; Elementary particle vacuum; Furnaces; Insulation; Oxidation; Semiconductor materials; Silicon; Thermal conductivity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Manufacturing Symposium, 2001 IEEE International
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    0-7803-6731-6
  • Type

    conf

  • DOI
    10.1109/ISSM.2001.963019
  • Filename
    963019