Title :
PD-related stresses in the bulk dielectric for ellipsoidal voids
Author :
Pedersen, A. ; Crichton, G.C. ; McAllister, I.W.
Author_Institution :
Dept. of Phys., Tech. Univ. Denmark, Lyngby, Denmark
Abstract :
In a previous study, the existence of a field enhancement in the solid dielectric in the vicinity of void undergoing PD activity was established. That study was undertaken with reference to a spherical void. In this paper, a more general investigation of this phenomenon of field enhancement is undertaken by extending the study to ellipsoidal voids
Keywords :
partial discharges; PD-related stresses; bulk dielectric; ellipsoidal voids; field enhancement; solid dielectric; Boundary conditions; Dielectrics; Ellipsoids; Fault location; Partial discharges; Permittivity; Physics; Power engineering and energy; Stress; Surface discharges;
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 1994., IEEE 1994 Annual Report., Conference on
Conference_Location :
Arlington, TX
Print_ISBN :
0-7803-1950-8
DOI :
10.1109/CEIDP.1994.591694
