• DocumentCode
    1841011
  • Title

    New chemical removing and air cooling technology for clean room recirculation air using chilled pure water showering method

  • Author

    Wakamatsu, Hidetoshi ; Matsuki, Mikio ; Tanaka, Norio ; Iwanaga, Yuji ; Murata, Koichi

  • Author_Institution
    Oki Electr. Ind. Co. Ltd., Tokyo, Japan
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    485
  • Lastpage
    488
  • Abstract
    We have developed a new chemical removing and air cooling technique for clean room recirculation air using a gas-liquid contact method that consists of a combination of chilled pure water showering and optimum packing material. We have tested a new treatment system using this technique in an actual photolithography clean room finding many kinds of chemical contaminants of water-solubility substances such as NH4+ and amine ions, and have found it to be a sufficiently practical wet-type filtration method having both functions of chemical cleanliness control and air cooling capacity control. In addition, this new system has a very simple structure, less power consumption and is maintenance free. Furthermore, the total cost including the initial and running cost of the new wet-type chemical filtration system for clean room recirculation air using our new technique can be reduced by about 30%, as compared with that of a conventional dry-type chemical filter removal system
  • Keywords
    air conditioning; clean rooms; cooling; environmental engineering; filtration; impurities; integrated circuit manufacture; photolithography; water; H2O; IC manufacture; NH4; air cooling capacity control; air cooling technique; amine ions; chemical cleanliness control; chemical contaminants; chemical removing technique; chilled pure water showering method; clean room recirculation air; gas-liquid contact method; maintenance free system; optimum packing material; photolithography clean room; power consumption reduction; treatment system; water-solubility substances; wet-type filtration method; Chemical technology; Control systems; Cooling; Costs; Energy consumption; Filters; Filtration; Lithography; System testing; Temperature control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Manufacturing Symposium, 2001 IEEE International
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    0-7803-6731-6
  • Type

    conf

  • DOI
    10.1109/ISSM.2001.963021
  • Filename
    963021