DocumentCode :
1841044
Title :
Key Considerations in RFIC Production Test
Author :
Barr, John
Author_Institution :
RF Manufacturing Test Engineering Manager, Santa Rosa System Division, Hewlett Packard
Volume :
27
fYear :
1995
fDate :
34820
Firstpage :
36
Lastpage :
45
Abstract :
In the highly competitive world of RFICs and Wireless Communications, component production test plays a key role. While the main objective is to test the most product possible in the least amount of time and minimal added cost, many key factors need to be considered to successfully achieve that goal. This paper addresses those key considerations and provide insight into successfully achieving the goals of RFIC production test.
Keywords :
Circuit testing; Costs; Integrated circuit testing; Life testing; Manufacturing; Production systems; Radio frequency; Radiofrequency integrated circuits; System testing; Time to market;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
ARFTG Conference Digest-Spring, 45th
Conference_Location :
Orlando, FL, USA
Print_ISBN :
0-7803-5686-1
Type :
conf
DOI :
10.1109/ARFTG.1995.327104
Filename :
4119781
Link To Document :
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