Title :
Statically triggered active ESD clamps for high-voltage applications
Author :
Cao, Yiqun ; Glaser, Ulrich
Author_Institution :
Infineon Technol., Neubiberg, Germany
Abstract :
In high-voltage and especially automotive applications ranging typically from 10 to 100V operation voltage, statically triggered active ESD clamps are often used due to their false triggering safety. This work presents advanced statically triggered active ESD clamps with enhanced tailoring to the application requirements, thereby improving clamp area efficiency and significantly reducing ESD window requirements.
Keywords :
clamps; electrostatic discharge; trigger circuits; ESD window; clamp area efficiency; false triggering safety; high-voltage applications; statically triggered active ESD clamps; voltage 10 V to 100 V; Clamps; Electrostatic discharges; Logic gates; Semiconductor optical amplifiers; Transistors; Trigger circuits; Video recording;
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2012 34th
Conference_Location :
Tucson, AZ
Print_ISBN :
978-1-4673-1467-1
