Title :
A flexible simulation model for system level ESD stresses with application to ESD design and troubleshooting
Author :
Mertens, Robert ; Kunz, Hans ; Salman, Akram ; Boselli, Gianluca ; Rosenbaum, Elyse
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
Abstract :
A new simulation model, emphasizing integrated circuit testing applications, is proposed for contract discharge from an ESD gun, such as those used for IEC 61000-4-2 and ISO 10605 system-level ESD qualification. Waveforms from simulation are compared with the IEC-61000-4-2 waveform specification and reference waveform. An example application of the model is also presented.
Keywords :
electrostatic discharge; integrated circuit testing; ESD design; ESD gun; IEC-61000-4-2 waveform specification; ISO 10605 system-level ESD qualification; contract discharge; flexible simulation model; integrated circuit testing; reference waveform; system level ESD stresses; troubleshooting; Capacitors; Discharges (electric); Electrostatic discharges; Integrated circuit modeling; Load modeling; RLC circuits; Stress;
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2012 34th
Conference_Location :
Tucson, AZ
Print_ISBN :
978-1-4673-1467-1
