DocumentCode :
1841336
Title :
T-ray imaging: new possibilities in the far infrared
Author :
Mittleman, D.M.
Author_Institution :
Electr. & Comput. Eng. Dept., Rice Univ., Houston, TX, USA
Volume :
3
fYear :
2002
fDate :
2-7 June 2002
Firstpage :
1575
Abstract :
Since the initial demonstrations of T-ray imaging in 1995, there has been considerable progress in the development of this field. Many possible applications have been explored, and a commercial terahertz time-domain spectrometer is now operating in a manufacturing environment. In addition, several new imaging techniques which exploit the unique properties of the THz system have been developed. We describe one technique, which permits time-of-flight imaging with depth resolution well below the Rayleigh limit. We demonstrate the capability to resolve two reflecting surfaces separated by only a few percent of the coherence length of the THz radiation.
Keywords :
submillimetre wave imaging; time of flight spectrometers; T-ray imaging; coherence length; depth resolution; far infrared imaging system; reflecting surface; terahertz time-domain spectrometer; time-of-flight imaging; Bandwidth; Frequency conversion; Image resolution; Infrared imaging; Manufacturing; Optical imaging; Spatial resolution; Spectroscopy; Time domain analysis; Ultrafast optics;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest, 2002 IEEE MTT-S International
Conference_Location :
Seattle, WA, USA
ISSN :
0149-645X
Print_ISBN :
0-7803-7239-5
Type :
conf
DOI :
10.1109/MWSYM.2002.1012157
Filename :
1012157
Link To Document :
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