Title :
Guidelines for Design and Testing at Millimeter Wave Frequencies
Author :
Finke, Ronald J. ; Kaputa, Douglas J.
Author_Institution :
Martin Marietta Laboratories - Syracuse, N.Y.
Abstract :
In recent years, the advancement in PHEMT device technology has pushed the operational frequency of many new devices to millimeter wave frequencies. This abstract summarizes some of the problems and solutions encountered in designing and testing circuits which operate at these frequencies. Device modeling, both linear and nonlinear is an integral part of any amplifier design process.
Keywords :
Calibration; Circuit testing; Design automation; Guidelines; Laboratories; Millimeter wave circuits; Millimeter wave technology; PHEMTs; Probes; Radio frequency;
Conference_Titel :
ARFTG Conference Digest-Spring, 45th
Conference_Location :
Orlando, FL, USA
Print_ISBN :
0-7803-5686-1
DOI :
10.1109/ARFTG.1995.327117
