DocumentCode
1841396
Title
A design strategy for 8 kV/contact 15 kV/air gap IEC 61000-4-2 robustness without on board suppressors
Author
Gallerano, Antonio ; Concannon, Ann ; Johnson, Martin ; Kwong, Wenky ; Fish, Adam ; Dahl, Randy ; Imholte, James ; Camp, Donald
Author_Institution
Texas Instrum., Santa Clara, CA, USA
fYear
2012
fDate
9-14 Sept. 2012
Firstpage
1
Lastpage
7
Abstract
We present an IC design strategy capable of achieving 8 kV contact/15 kV air gap ESD robustness in-system according to the IEC 61000-4-2 standard without the need of additional suppressors on board. This result has been achieved with a LVTSCR, developed via wafer level TLP/HBM/HMM testing and verified in system using gun testing.
Keywords
IEC standards; air gaps; electrical contacts; electrostatic discharge; integrated circuit design; semiconductor device models; semiconductor device testing; thyristors; IC design strategy; LVTSCR; air gap ESD robustness in-system; air gap IEC 61000-4-2 robustness; gun testing; human body model; transmission line pulser; voltage 15 kV; voltage 8 kV; wafer level TLP-HBM-HMM testing; Clamps; Electrostatic discharges; Hidden Markov models; Metals; Pins; Robustness; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2012 34th
Conference_Location
Tucson, AZ
ISSN
0739-5159
Print_ISBN
978-1-4673-1467-1
Type
conf
Filename
6333336
Link To Document