Title :
Characterizing devices using the IEC 61000-4-5 surge stress
Author :
Marum, Steve ; Kemper, Wolfgang ; Lin, Yen-Yi ; Barker, Paul
Author_Institution :
Marum Consulting, Sherman, TX, USA
Abstract :
Many systems need to survive the IEC 61000-4-5 surge stress. Characterizing protection devices and input circuitry using this stress pulse provides information useful when designing such systems. Data taken with this surge pulse can also be used to determine ESD behavior.
Keywords :
IEC standards; electrostatic discharge; stress analysis; surge protection; ESD behavior; IEC 61000-4-5 surge stress; characterizing devices; protection devices; stress pulse; surge pulse; Electrostatic discharges; Fingers; IEC standards; Metals; Stress; Surge protection; Surges;
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2012 34th
Conference_Location :
Tucson, AZ
Print_ISBN :
978-1-4673-1467-1
