• DocumentCode
    1841471
  • Title

    Design and synthesis for timing error tolerance

  • Author

    Chang, Shih-Chieh ; Hsieh, Cheng-Tao

  • Author_Institution
    Dept. of Comput. Sci., Nat. Tsing Hua Univ., Hsinchu, Taiwan
  • fYear
    2005
  • fDate
    27-29 April 2005
  • Firstpage
    53
  • Lastpage
    54
  • Abstract
    Delay variation factors are often statistic in nature. Here, we review and compare three new design and re-synthesis techniques which can improve the yield of a design. The first one uses sizing algorithms for yield improvement in the presence of the process variation. Another technique adds triple module redundancy (TMR) like structure to tolerate delay variations. Finally, the last research uses fault correction to resolve design uncertainty issues.
  • Keywords
    delays; integrated circuit design; integrated circuit yield; statistical analysis; timing; delay variation; design uncertainty; fault correction; process variation; re-synthesis techniques; sizing algorithms; timing error tolerance; triple module redundancy; yield improvement; Circuit noise; Clocks; Crosstalk; Delay; Design optimization; Error correction; Latches; Redundancy; Statistics; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Design, Automation and Test, 2005. (VLSI-TSA-DAT). 2005 IEEE VLSI-TSA International Symposium on
  • Print_ISBN
    0-7803-9060-1
  • Type

    conf

  • DOI
    10.1109/VDAT.2005.1500018
  • Filename
    1500018