DocumentCode :
1841471
Title :
Design and synthesis for timing error tolerance
Author :
Chang, Shih-Chieh ; Hsieh, Cheng-Tao
Author_Institution :
Dept. of Comput. Sci., Nat. Tsing Hua Univ., Hsinchu, Taiwan
fYear :
2005
fDate :
27-29 April 2005
Firstpage :
53
Lastpage :
54
Abstract :
Delay variation factors are often statistic in nature. Here, we review and compare three new design and re-synthesis techniques which can improve the yield of a design. The first one uses sizing algorithms for yield improvement in the presence of the process variation. Another technique adds triple module redundancy (TMR) like structure to tolerate delay variations. Finally, the last research uses fault correction to resolve design uncertainty issues.
Keywords :
delays; integrated circuit design; integrated circuit yield; statistical analysis; timing; delay variation; design uncertainty; fault correction; process variation; re-synthesis techniques; sizing algorithms; timing error tolerance; triple module redundancy; yield improvement; Circuit noise; Clocks; Crosstalk; Delay; Design optimization; Error correction; Latches; Redundancy; Statistics; Timing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Design, Automation and Test, 2005. (VLSI-TSA-DAT). 2005 IEEE VLSI-TSA International Symposium on
Print_ISBN :
0-7803-9060-1
Type :
conf
DOI :
10.1109/VDAT.2005.1500018
Filename :
1500018
Link To Document :
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