DocumentCode
1841471
Title
Design and synthesis for timing error tolerance
Author
Chang, Shih-Chieh ; Hsieh, Cheng-Tao
Author_Institution
Dept. of Comput. Sci., Nat. Tsing Hua Univ., Hsinchu, Taiwan
fYear
2005
fDate
27-29 April 2005
Firstpage
53
Lastpage
54
Abstract
Delay variation factors are often statistic in nature. Here, we review and compare three new design and re-synthesis techniques which can improve the yield of a design. The first one uses sizing algorithms for yield improvement in the presence of the process variation. Another technique adds triple module redundancy (TMR) like structure to tolerate delay variations. Finally, the last research uses fault correction to resolve design uncertainty issues.
Keywords
delays; integrated circuit design; integrated circuit yield; statistical analysis; timing; delay variation; design uncertainty; fault correction; process variation; re-synthesis techniques; sizing algorithms; timing error tolerance; triple module redundancy; yield improvement; Circuit noise; Clocks; Crosstalk; Delay; Design optimization; Error correction; Latches; Redundancy; Statistics; Timing;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Design, Automation and Test, 2005. (VLSI-TSA-DAT). 2005 IEEE VLSI-TSA International Symposium on
Print_ISBN
0-7803-9060-1
Type
conf
DOI
10.1109/VDAT.2005.1500018
Filename
1500018
Link To Document