DocumentCode :
1841496
Title :
2010 Best Paper Award
fYear :
2012
fDate :
9-14 Sept. 2012
Firstpage :
1
Lastpage :
1
Abstract :
The 2010 Best Paper Award was presented to Yiqun Cao, Ulrich Glaser, Joost Willemen, Stephan Frei, and Matthias Stecher (of Infineon Technologies, and Technische Universitat Dortmund, Germany) for their article "On the Dynamic Destruction of LDMOS Transistors Beyond Voltage Overshoots in High Voltage ESD."
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2012 34th
Conference_Location :
Tucson, AZ, USA
ISSN :
0739-5159
Print_ISBN :
978-1-4673-1467-1
Type :
conf
Filename :
6333341
Link To Document :
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