Abstract :
The 2010 Best Paper Award was presented to Yiqun Cao, Ulrich Glaser, Joost Willemen, Stephan Frei, and Matthias Stecher (of Infineon Technologies, and Technische Universitat Dortmund, Germany) for their article "On the Dynamic Destruction of LDMOS Transistors Beyond Voltage Overshoots in High Voltage ESD."
