Title :
A process- and temperature-tolerant power-on reset circuit with a flexible detection level higher than the bandgap voltage
Author_Institution :
Micron Japan, Japan Flash Design Center, Tokyo
Abstract :
A process- and temperature-tolerant power-on reset (POR) circuit is described. The operation principle of the POR circuit is based on a Kuijk cell bandgap reference with one resistor added to enable a designed output voltage higher than the Bandgap voltage of 1.25V. A test circuit with a detection level of 2.0V was fabricated and measured with a temperature variation of 19mV from 25degC to 90degC and a standard deviation of 25mV across one wafer. The circuit occupies 0.064mm2 and dissipates 1.2A at 90degC.
Keywords :
analogue integrated circuits; integrated circuit design; LSI; POR; bandgap voltage; integrated circuit design; large scale integration; power-on reset circuit; resistor; standard deviation; test circuit; Analog circuits; Circuit testing; Equations; Flexible printed circuits; Latches; Photonic band gap; Resistors; Temperature dependence; Temperature measurement; Voltage;
Conference_Titel :
Circuits and Systems, 2008. ISCAS 2008. IEEE International Symposium on
Conference_Location :
Seattle, WA
Print_ISBN :
978-1-4244-1683-7
Electronic_ISBN :
978-1-4244-1684-4
DOI :
10.1109/ISCAS.2008.4541914
