Title :
Line-Reflect-Match Calibrations with Nonideal Microstrip Standards
Author :
Williams, Dylan F. ; Schappacher, Jerry B.
Author_Institution :
National Institute of Standards and Technology, 325 Broadway, Boulder, CO 80303
Abstract :
We apply a previously developed Line-Reflect-Match (LRM) calibration that compensates for the nonideal electrical behavior of the match standard to microstrip transmission lines and investigate impedance definitions, standard parasitics, and calibration accuracy.
Keywords :
Calibration; Circuit testing; Conductors; Electrical resistance measurement; Impedance; Microstrip; NIST; Probes; Resistors; Standards development;
Conference_Titel :
ARFTG Conference Digest-Fall, 46th
Conference_Location :
Scottsdale, AZ, USA
Print_ISBN :
0-7803-5686-1
DOI :
10.1109/ARFTG.1995.327130
