• DocumentCode
    1841640
  • Title

    Line-Reflect-Match Calibrations with Nonideal Microstrip Standards

  • Author

    Williams, Dylan F. ; Schappacher, Jerry B.

  • Author_Institution
    National Institute of Standards and Technology, 325 Broadway, Boulder, CO 80303
  • Volume
    28
  • fYear
    1995
  • fDate
    Nov. 1995
  • Firstpage
    35
  • Lastpage
    38
  • Abstract
    We apply a previously developed Line-Reflect-Match (LRM) calibration that compensates for the nonideal electrical behavior of the match standard to microstrip transmission lines and investigate impedance definitions, standard parasitics, and calibration accuracy.
  • Keywords
    Calibration; Circuit testing; Conductors; Electrical resistance measurement; Impedance; Microstrip; NIST; Probes; Resistors; Standards development;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ARFTG Conference Digest-Fall, 46th
  • Conference_Location
    Scottsdale, AZ, USA
  • Print_ISBN
    0-7803-5686-1
  • Type

    conf

  • DOI
    10.1109/ARFTG.1995.327130
  • Filename
    4119808
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1841640