Dynamic X-parameters*: Behavioral modeling in the presence of long term memory effects

Author

Verspecht, Jan ; Root, David ; Nielsen, Troels

Author_Institution

Agilent Technol., Inc., Santa Clara, CA, USA

fYear

2012

fDate

12-14 March 2012

Firstpage

1

Lastpage

4

Abstract

An original way is presented to model memory effects of RF and microwave components by extending the X-parameter model. The approach can be used to model hard nonlinear behavior and long term memory effects and is valid for all possible modulation formats, for all possible peak-to-average ratios and for a wide range of modulation bandwidths. The model works for pulsed signals as well as for two-tone and multitone signals. The model has been validated by measurements and is compatible with existing harmonic balance simulators.

Keywords

microwave devices; modulation; signal processing; RF component; dynamic X-parameter model; hard nonlinear behavior modeling; harmonic balance simulator; long term memory effect modeling; microwave component; modulation bandwidth; modulation format; multitone signal; peak-to-average ratio; pulsed signal; two-tone signal; Kernel; Mathematical model; Microwave amplifiers; Microwave circuits; Modulation; Wideband; behavioral model; frequency domain; measurements; memory effects;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave Conference (GeMiC), 2012 The 7th German

Conference_Location

Ilmenau

Print_ISBN

978-1-4577-2096-3

Electronic_ISBN

978-3-9812668-4-9

Type

conf

Filename

6185156